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IEEE/ICACT20260190 Slide.01
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Good morning, everyone. Thank you for the opportunity to present our work today. My name is Minsu Kim, and I am presenting on behalf of our research team from Sungkyunkwan University and LS-THiRAUTECH. Our paper is titled "Unsupervised Learning-Based Defect Detection in PCB Circuit Images for Automated Quality Inspection." This work is a collaboration between the Department of Smart Factory Convergence at Sungkyunkwan University and the Research and Development Center at LS-THiRAUTECH Co., Ltd. | |
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