IEEE/ICACT20210139 Slide.12
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IEEE/ICACT20210139 Slide.12
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Lastly, through port transmission of varied height of buried oxide. Based on the results, it is seen that as the height of the buried oxide increases, FSR remains the same at a value of 33.6nm. As we increased the height of buried oxide, FWHM is remains at the same value of 0.97nm while Q-factor is calculated to be 1573. From the results, it is clearly observed that varying in height of buried oxide have no effect on its FSR, FWHM and Q-factor. | |
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